Scanning Electron Ion Probe Microscopy in Materials Characterization

The Scanning Electron/Ion/Probe Microscopy in Materials Characterization certification course requires interested candidates to hold an M.Sc. or BE degree. The Scanning Electron/Ion/Probe Microscopy in Materials Characterization certification is only available for candidates who secure an adequate final score, which will be the sum of his/her examination score and average assignment marking. Swayam will consider 75% of the test’s score (out of 100) and 25% of the assignment marks (best six out of the total eight). To achieve certification, aspirants should acquire >=10/25 for their in-course assessments and >=30/75 for their proctored exam. Failing to maintain this, candidates cannot receive certificates even after getting >=40/100 or more.